POSSIBLE SOURCE OF ERROR IN DETERMINATION OF TYPE OF SMALL LATTICE-DEFECTS FROM ELECTRON-MICROGRAPHS

被引：6

作者：

HERTEL, B ^{[1
]}

KATERBAU, KH ^{[1
]}

BAIR, R ^{[1
]}

机构：

[1] MAX PLANCK INST MET FORSCH,D-7000 STUTTGART 1,FED REP GER

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1977年 / 41卷 / 01期

关键词：

D O I：

10.1002/pssa.2210410144

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K1 / &

共 7 条

[1]

EYRE BL, 1972, DEFECTS REFRACTORY M, P311

HERTEL, B ;

DIEHL, J .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 33 (02) :K73-&

KATERBAU, KH .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 38 (02) :463-476

[4]

KATERBAU KH, TO BE PUBLISHED

RUHLE, M .

PHYSICA STATUS SOLIDI, 1967, 19 (01) :263-&

[6]

Wilkens M., 1970, Modern diffraction and imaging techniques in material science, P233

[7]

WILKENS M, 1975, ELECTRON MICROS, P647