THE BEHAVIOR AND CALIBRATION OF SOME PIEZOELECTRIC CERAMICS USED IN THE STM

被引：59

作者：

VIEIRA, S

机构：

来源：

关键词：

D O I：

10.1147/rd.305.0553

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：553 / 556

页数：4

共 7 条

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[7] SILICON CELL FOR THE PRECISE MEASUREMENT OF THERMAL-EXPANSION AT LOW-TEMPERATURES - RESULTS FOR CU AND NAF
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (01) : 27 - 31