MORPHOLOGY AND STRUCTURE OF TIO2 THIN-LAYERS VS THICKNESS AND SUBSTRATE-TEMPERATURE

[1] HREM STUDY OF CRYSTALLINE AND AMORPHOUS REGIONS OF A TIO2 THIN-LAYER - MODIFICATION OF THE LATTICE-PARAMETER INSIDE SMALL CLUSTERS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 94 (02): : 499 - 506

[2] MACLEOD HA, 1981, P SOC PHOTO-OPT INST, V288, P580, DOI 10.1117/12.932100

[3] MANSOT JL, 1984, VIDE COUCHE MINCES, V223, P375

[4] REVISED STRUCTURE ZONE MODEL FOR THIN-FILM PHYSICAL STRUCTURE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 500 - 503

[5] Pratt WK, 2001, DIGITAL IMAGE PROCES

[6] Pulker H., 1999, COATINGS GLASS

[7] REFRACTIVE-INDEXES OF TIO2 FILMS PRODUCED BY REACTIVE EVAPORATION OF VARIOUS TITANIUM-OXYGEN PHASES [J]. APPLIED OPTICS, 1976, 15 (12): : 2986 - 2991

[8] STUDY OF SURFACE-ROUGHNESS USING A MICRO-DENSITOMETER ANALYSIS OF ELECTRON-MICROGRAPHS OF SURFACE REPLICAS .1. SURFACE PROFILES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (09) : 1124 - 1133

[9] INSITU AND AIR INDEX MEASUREMENTS - INFLUENCE OF THE DEPOSITION PARAMETERS ON THE SHIFT OF TIO2/SIO2 FABRY-PEROT FILTERS [J]. APPLIED OPTICS, 1986, 25 (21): : 3909 - 3915

[10] COMPUTER-SIMULATION OF THIN-FILM GROWTH - APPLYING THE RESULTS TO OPTICAL COATINGS [J]. OPTICAL ENGINEERING, 1986, 25 (01) : 142 - 147

[1] HREM STUDY OF CRYSTALLINE AND AMORPHOUS REGIONS OF A TIO2 THIN-LAYER - MODIFICATION OF THE LATTICE-PARAMETER INSIDE SMALL CLUSTERS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 94 (02): : 499 - 506

[2] MACLEOD HA, 1981, P SOC PHOTO-OPT INST, V288, P580, DOI 10.1117/12.932100

[3] MANSOT JL, 1984, VIDE COUCHE MINCES, V223, P375

[4] REVISED STRUCTURE ZONE MODEL FOR THIN-FILM PHYSICAL STRUCTURE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 500 - 503

[5] Pratt WK, 2001, DIGITAL IMAGE PROCES

[6] Pulker H., 1999, COATINGS GLASS

[7] REFRACTIVE-INDEXES OF TIO2 FILMS PRODUCED BY REACTIVE EVAPORATION OF VARIOUS TITANIUM-OXYGEN PHASES [J]. APPLIED OPTICS, 1976, 15 (12): : 2986 - 2991

[8] STUDY OF SURFACE-ROUGHNESS USING A MICRO-DENSITOMETER ANALYSIS OF ELECTRON-MICROGRAPHS OF SURFACE REPLICAS .1. SURFACE PROFILES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (09) : 1124 - 1133

[9] INSITU AND AIR INDEX MEASUREMENTS - INFLUENCE OF THE DEPOSITION PARAMETERS ON THE SHIFT OF TIO2/SIO2 FABRY-PEROT FILTERS [J]. APPLIED OPTICS, 1986, 25 (21): : 3909 - 3915

[10] COMPUTER-SIMULATION OF THIN-FILM GROWTH - APPLYING THE RESULTS TO OPTICAL COATINGS [J]. OPTICAL ENGINEERING, 1986, 25 (01) : 142 - 147