HOW TO DETERMINE PARAMETERS OF DEEP LEVELS BY DLTS SINGLE TEMPERATURE SCANNING

被引：25

作者：

GOTO, H

ADACHI, Y

IKOMA, T

机构：

[1] Institute of Industrial Science, University of Tokyo, Tokyo, 7-22-1, Roppongi, Minato-ku

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1979年 / 18卷 / 10期

关键词：

D O I：

10.1143/JJAP.18.1979

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A simplified method of determining the energy level and the capture cross-section of a deep level from the DLTS spectrum is proposed, together with a detailed analysis of its spectrum shape. Since this method requires only a single temperature scan, the time necessary to determine parameters from the DLTS becomes greatly shortened. © 1979 The Japan Society of Applied Physics.

引用

页码：1979 / 1982

页数：4