SIZE DETERMINATION OF SEMICONDUCTOR NANOCRYSTALLITES IN GLASSES BY LOW-FREQUENCY INELASTIC-SCATTERING (LOFIS)

被引:28
作者
CHAMPAGNON, B
ANDRIANASOLO, B
DUVAL, E
机构
[1] Laboratoire de Physico-chimie des Matériaux Luminescents, URA 442 CNRS Université Lyon 1
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1991年 / 9卷 / 04期
关键词
D O I
10.1016/0921-5107(91)90064-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Low frequency inelastic scattering (LOFIS) concerns Raman scattering of light below 100 cm-1; in this frequency range the eigenmodes of small crystallites give rise to low frequency lines whose position depends on the crystallite sizes. LOFIS of various CdS(x)Se1-x semiconductor-doped glasses was analysed and diameters between 2 and 10 nm were obtained. Resonance effects strongly enhanced the longitudinal optical (LO) phonons. The influence of confinement on the scattering of light by LO phonons is discussed.
引用
收藏
页码:417 / 420
页数:4
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