CARRIER TRANSPORT NEAR THE SI/SIO2 INTERFACE OF A MOSFET

被引：160

作者：

HANSCH, W

VOGELSANG, T

KIRCHER, R

ORLOWSKI, M

机构：

来源：

SOLID-STATE ELECTRONICS | 1989年 / 32卷 / 10期

关键词：

D O I：

10.1016/0038-1101(89)90060-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：839 / 849

页数：11

共 31 条

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