SURFACE-STRUCTURE OF GE(100) STUDIED BY HE DIFFRACTION

被引：48

作者：

LAMBERT, WR

TREVOR, PL

CARDILLO, MJ

SAKAI, A

HAMANN, DR

机构：

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.35.8055

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：8055 / 8064

页数：10

共 25 条

[1] MOLECULAR-BEAM APPARATUS FOR STUDY OF GAS-SURFACE INTERACTIONS [J].

CARDILLO, MJ ;

CHING, CSY ;

GREENE, EF ;

BECKER, GE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02) :423-428

[2] ORDER AND STRUCTURE OF SEMICONDUCTOR SURFACES - AN ASSESSMENT WITH HE DIFFRACTION [J].

CARDILLO, MJ ;

LAMBERT, WR .

SURFACE SCIENCE, 1986, 168 (1-3) :724-733

[3] DIFFRACTION OF HE AT THE RECONSTRUCTED SI(100) SURFACE [J].

CARDILLO, MJ ;

BECKER, GE .

PHYSICAL REVIEW B, 1980, 21 (04) :1497-1510

[4] THE DIFFRACTION OF HE ATOMS AT THE GAAS(110) SURFACE [J].

CARDILLO, MJ ;

BECKER, GE ;

SIBENER, SJ ;

MILLER, DR .

SURFACE SCIENCE, 1981, 107 (2-3) :469-493

[5] ATOMIC AND ELECTRONIC-STRUCTURES OF RECONSTRUCTED SI(100) SURFACES [J].

CHADI, DJ .

PHYSICAL REVIEW LETTERS, 1979, 43 (01) :43-47

[6] SUBSURFACE STRAIN IN THE GE(001) AND GE(111) SURFACES AND COMPARISON TO SILICON [J].

CULBERTSON, RJ ;

KUK, Y ;

FELDMAN, LC .

SURFACE SCIENCE, 1986, 167 (01) :127-140

[7] DEPENDENCE OF THE HE-SCATTERING POTENTIAL AT SURFACES ON THE SURFACE-ELECTRON-DENSITY PROFILE [J].

ESBJERG, N ;

NORSKOV, JK .

PHYSICAL REVIEW LETTERS, 1980, 45 (10) :807-810

[8] THE 2X1 RECONSTRUCTION OF THE GE(001) SURFACE [J].

FERNANDEZ, JC ;

YANG, WS ;

SHIH, HD ;

JONA, F ;

JEPSEN, DW ;

MARCUS, PM .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (03) :L55-L60

[9] QUANTUM-THEORY OF ATOM-SURFACE SCATTERING - DIFFRACTION AND RAINBOW [J].

GARIBALDI, U ;

LEVI, AC ;

SPADACINI, R ;

TOMMEI, GE .

SURFACE SCIENCE, 1975, 48 (02) :649-675

[10] SURFACE-CHARGE DENSITIES AND ATOM DIFFRACTION [J].

HAMANN, DR .

PHYSICAL REVIEW LETTERS, 1981, 46 (18) :1227-1230

← 1 2 3 →