FROM HOT-ELECTRON TRANSPORT-THEORY TO MACROSCOPIC NONLINEAR AND CHAOTIC BEHAVIOR INDUCED BY IMPACT IONIZATION IN SEMICONDUCTORS

被引：15

作者：

SCHOLL, E

机构：

来源：

关键词：

D O I：

10.1016/0038-1101(89)90202-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1129 / 1135

页数：7

共 30 条

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