DC AND SECOND DERIVATIVE LANGMUIR PROBE MEASURING SYSTEM

被引:7
作者
RICHARDS, SL
JONES, RP
LLOYD, GJ
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 06期
关键词
D O I
10.1088/0022-3735/5/6/034
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:595 / &
相关论文
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