HIGH PASS PHOTO-CATHODE X-RAY IONIZATION-CHAMBER FOR SURFACE EXAFS

被引：27

作者：

SHEVCHIK, NJ

FISCHER, DA

机构：

[1] Physics Department, State University of New York, Stony Brook

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1979年 / 50卷 / 05期

关键词：

D O I：

10.1063/1.1135884

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An x-ray detector that collects electrons emitted from a cathode plate and amplifies them through field intensified ionization in helium gas is described. The sensitivity of the detector to the photon frequency increases by nearly an order of magnitude as the photon energy exceeds the absorption edge of the photocathode. The detector current as a function of the x-ray frequency is shown to yield the extended x-ray absorption fine structure (EXAFS) of layers of copper as thin as 30 Å in a few minutes.

引用

页码：577 / 581

页数：5

共 13 条

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