FURTHER APPLICATIONS OF FUZZY-LOGIC TO RELIABILITY ASSESSMENT AND SAFETY ANALYSIS

被引：26

作者：

KELLER, AZ

KARAZAITRI, C

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1989年 / 29卷 / 03期

关键词：

D O I：

10.1016/0026-2714(89)90627-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：399 / 404

页数：6

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