ATOMIC MORPHOLOGY OF THIN-FILMS IN THE EARLY STAGES OF GROWTH

被引:4
作者
KROHN, M
机构
[1] Institute of Solid State Physics and Electron Microscopy, Academy of Sciences, GDR, 4050 Halle (Saale)
关键词
D O I
10.1016/0042-207X(90)93876-K
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Various mechanisms of thin film growth are discussed on the basis of a comparative study of the atomic surface structure of NaCl and AgBr films revealed by means of decoration techniques. For epitaxial growth a distinction is made between free and constricted propagation of growth lamellae. In polycrystalline films rounded and polyhedral surface morphologies are discussed in terms of their atomic step structure. © 1990.
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页码:1091 / 1093
页数:3
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