MINIMUM DIFFERENCES IN HEIGHT DETECTABLE IN ELECTRON STEREOMICROSCOPY

被引:20
作者
NANKIVELL, JF
机构
来源
BRITISH JOURNAL OF APPLIED PHYSICS | 1962年 / 13卷 / 03期
关键词
D O I
10.1088/0508-3443/13/3/310
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:126 / &
相关论文
共 5 条
[1]  
ANDERSON TF, 1958, 4 INT C EL MICR
[2]   SOURCES OF ERROR IN ELECTRON STEREOMICROSCOPY [J].
GARROD, RI ;
NANKIVELL, JF .
BRITISH JOURNAL OF APPLIED PHYSICS, 1958, 9 (06) :214-218
[3]   Electron microscopic determination of surface elevations and orientations [J].
Heidenreich, RD ;
Matheson, LA .
JOURNAL OF APPLIED PHYSICS, 1944, 15 (05) :423-435
[4]  
RUHLE R, 1949, OPTIK, V5, P534
[5]   CORRECTION OF ERRORS IN ELECTRON STEREOMICROSCOPY [J].
WELLS, OC .
BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (05) :199-201