FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS

被引:150
作者
ALLEN, SM
机构
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1981年 / 43卷 / 02期
关键词
D O I
10.1080/01418618108239412
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
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页码:325 / 335
页数:11
相关论文
共 8 条
[1]  
BLAKE RG, 1978, PHILOS MAG A, V37, P1, DOI 10.1080/01418617808239158
[2]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[3]   ELECTRON DIFFRACTION STUDY OF MGO HOO SYSTEMATIC INTERACTIONS [J].
GOODMAN, P ;
LEHMPFUHL, G .
ACTA CRYSTALLOGRAPHICA, 1967, 22 :14-+
[4]  
HALL EL, 1975, PHIL MAG, V32, P1298
[5]  
HIRSCH PB, 1965, ELECTRON MICROSCOPY
[6]   ABSORPTION PARAMETERS IN ELECTRON DIFFRACTION THEORY [J].
HUMPHREYS, CJ ;
HIRSCH, PB .
PHILOSOPHICAL MAGAZINE, 1968, 18 (151) :115-+
[7]   DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].
KELLY, PM ;
JOSTSONS, A ;
BLAKE, RG ;
NAPIER, JG .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02) :771-780
[8]  
VICTOREEN JA, 1962, INT TABLES XRAY CRYS, V3, P237