STATISTICAL DESIGN CENTERING AND TOLERANCING USING PARAMETRIC SAMPLING

被引：84

作者：

SINGHAL, K ^{[1
]}

PINEL, JF ^{[1
]}

机构：

[1] BELL NO RES,OTTAWA K1Y 4H7,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1981年 / 28卷 / 07期

关键词：

D O I：

10.1109/TCS.1981.1085029

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：692 / 702

页数：11

共 21 条

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DIRECTOR, SW ;

HACHTEL, GD .

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Kjellstrom G., 1975, 1975 IEEE International Symposium on Circuits and Systems, P321

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KJELLSTROM G, 1976, 1976 P IEEE INT S CI, P714