CARRIER-WAVELENGTH EFFECT ON SCREENING IN SEMICONDUCTORS

被引:21
作者
REDFIELD, D
AFROMOWI.MA
机构
[1] RCA Laboratories, Princeton, NJ
[2] Columbia University, New York, NY
来源
PHILOSOPHICAL MAGAZINE | 1969年 / 19卷 / 160期
关键词
D O I
10.1080/14786436908216337
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The validity criteria for both the Debye-Huckel and Thomas-Fermi screening length formulas are evaluated for semiconductors and shown to be unsatisfied over most interesting ranges of temperatures and carrier concentration. Then a new consideration—the wavelength of the screening carriers—is introduced and compared with the calculated screening lengths. From this comparison it is shown that values of screening length obtained in most cases are not self-consistent with the derivation of the formulas. © 1969 Taylor & Francis Group, LLC.
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页码:831 / &
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