OBSERVATIONS OF SILICON-CARBIDE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：33

作者：

SMITH, DJ ^{[1
]}

JEPPS, NW ^{[1
]}

PAGE, TF ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,CAMBRIDGE CB2 3QZ,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1978年 / 114卷 / SEP期

关键词：

D O I：

10.1111/j.1365-2818.1978.tb00112.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：1 / 18

页数：18

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