DETAILED EXPERIMENTAL INVESTIGATION OF THE BARRIER-HEIGHT LOWERING AND THE TIP-SAMPLE FORCE GRADIENT DURING STM OPERATION IN AIR

被引:25
作者
MEEPAGALA, SC
REAL, F
机构
[1] Department of Physics, Polytechnic University, Brooklyn
来源
PHYSICAL REVIEW B | 1994年 / 49卷 / 15期
关键词
D O I
10.1103/PhysRevB.49.10761
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using a combined scanning-tunnel-microscopy (STM)/atomic-force microscopy (AFM) setup, we have measured simultaneously the apparent barrier height and the tip-sample force gradient for various tip-sample distances of an STM configuration in air. Our results reconfirm the existence of repulsive tip-sample forces during the STM operation with inert metal systems in air. Also, the gradient of such forces is of the correct sign that is necessary to cause the lowering of the apparent barrier heights through elastic deformations. However, our results indicate that the model that is based on the elastic deformation due to the tip-sample forces does not provide a satisfactory explanation of the lowering of the barrier heights for the case of gold in air.
引用
收藏
页码:10761 / 10763
页数:3
相关论文
共 14 条
  • [1] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP
    BINNIG, G
    ROHRER, H
    GERBER, C
    WEIBEL, E
    [J]. APPLIED PHYSICS LETTERS, 1982, 40 (02) : 178 - 180
  • [2] NANOMECHANICS OF A AU-IR CONTACT USING A BIDIRECTIONAL ATOMIC FORCE MICROSCOPE
    COHEN, SR
    NEUBAUER, G
    MCCLELLAND, GM
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3449 - 3454
  • [3] PROPERTIES OF VACUUM TUNNELING CURRENTS - ANOMALOUS BARRIER HEIGHTS
    COOMBS, JH
    PETHICA, JB
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 455 - 459
  • [4] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY
    DURIG, U
    GIMZEWSKI, JK
    POHL, DW
    [J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406
  • [5] TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY
    GIMZEWSKI, JK
    MOLLER, R
    [J]. PHYSICAL REVIEW B, 1987, 36 (02): : 1284 - 1287
  • [6] APPARENT BARRIER HEIGHT IN SCANNING TUNNELING MICROSCOPY
    LANG, ND
    [J]. PHYSICAL REVIEW B, 1988, 37 (17): : 10395 - 10398
  • [7] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE
    MAMIN, HJ
    GANZ, E
    ABRAHAM, DW
    THOMSON, RE
    CLARKE, J
    [J]. PHYSICAL REVIEW B, 1986, 34 (12): : 9015 - 9018
  • [8] DIRECT MEASUREMENT OF FORCES DURING SCANNING TUNNELING MICROSCOPE IMAGING OF GRAPHITE
    MATE, CM
    ERLANDSSON, R
    MCCLELLAND, GM
    CHIANG, S
    [J]. SURFACE SCIENCE, 1989, 208 (03) : 473 - 486
  • [9] MEEAGALA SC, 1991, J VAC SCI TECHNOL B, V9, P1340
  • [10] COMPACT SCANNING TUNNELING MICROSCOPE WITH EASY-TO-CONSTRUCT X-Z INERTIAL SAMPLE TRANSLATION
    MEEPAGALA, SC
    REAL, F
    REYES, CB
    NOVOSELSKAYA, A
    RONG, Z
    WOLF, EL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3555 - 3557