HIGH MASS RESOLUTION ION MICROPROBE MASS-SPECTROMETRY OF COMPLEX MATRICES

[1] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[2] ARDENNE M, 1962, TABELLEN ELKTRONENPH, V1, P653

[3] BANNER AE, 1972, 20 A M AM SOC MASS S, P150

[4] BATEMAN R, 1973, COMMUNICATION

[5] INFLUENCE OF CHEMISORPTION OF OXYGEN AND NITROGEN ON SECONDARY ION EMISSION OF MONOCRYSTALLINE SAMPLES OF NICKEL AND NICKEL-CHROMIUM ALLOY [J]. SURFACE SCIENCE, 1973, 40 (01) : 169 - 178

[6] ANALYSIS OF THIN SILICA FILMS BY SECONDARY ION EMISSION [J]. MATERIALS RESEARCH BULLETIN, 1971, 6 (12) : 1283 - +

[7] SIMPLE ION PROBE ATTACHMENT FOR EXISTING MASS SPECTROMETERS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (14) : 2171 - 2176

[8] SPECTRAL INTERFERENCES IN SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED SPECTROSCOPY, 1973, 27 (04) : 274 - 279

[9] SCANNING ION MICROSCOPY AND ION BEAM MICRO-MACHINING [J]. NATURE, 1967, 215 (5104) : 950 - &

[10] DRUMMOND IW, 1968, THESIS CAMBRIDGE U

[1] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[2] ARDENNE M, 1962, TABELLEN ELKTRONENPH, V1, P653

[3] BANNER AE, 1972, 20 A M AM SOC MASS S, P150

[4] BATEMAN R, 1973, COMMUNICATION

[5] INFLUENCE OF CHEMISORPTION OF OXYGEN AND NITROGEN ON SECONDARY ION EMISSION OF MONOCRYSTALLINE SAMPLES OF NICKEL AND NICKEL-CHROMIUM ALLOY [J]. SURFACE SCIENCE, 1973, 40 (01) : 169 - 178

[6] ANALYSIS OF THIN SILICA FILMS BY SECONDARY ION EMISSION [J]. MATERIALS RESEARCH BULLETIN, 1971, 6 (12) : 1283 - +

[7] SIMPLE ION PROBE ATTACHMENT FOR EXISTING MASS SPECTROMETERS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (14) : 2171 - 2176

[8] SPECTRAL INTERFERENCES IN SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED SPECTROSCOPY, 1973, 27 (04) : 274 - 279

[9] SCANNING ION MICROSCOPY AND ION BEAM MICRO-MACHINING [J]. NATURE, 1967, 215 (5104) : 950 - &

[10] DRUMMOND IW, 1968, THESIS CAMBRIDGE U