AN EXPERIMENTAL FACILITY FOR THE STUDY OF EFFECTS OF HEAVY-ION IRRADIATION ON LOGIC MICROCIRCUITS

被引:3
作者
MUSSEAU, O
LERAY, JL
PATIN, Y
COIC, YM
机构
关键词
D O I
10.1016/0168-583X(87)90186-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:443 / 452
页数:10
相关论文
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