IMPROVED BIAS AND STABILITY IN DUAL-EXCHANGE-BIASED UNSHIELDED MAGNETORESISTIVE HEADS

被引：11

作者：

CAIN, WC ^{[1
]}

KRYDER, MH ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,MAGNET TECHNOL CTR,PITTSBURGH,PA 15213

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1990年 / 26卷 / 05期

关键词：

D O I：

10.1109/20.104748

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Data is presented for dual-exchange-biased NiFe-TbCo UMR tape heads with improved signal response and process stability. It was found that a Si3N4 passivation layer offered better stability of the exchange bias through head processing than SiO2. In order to improved sensor sensitivity, the longitudinal component of the exchange bias was reduced by increasing the exchange angle to 75° from the sense current direction. This resulted in a +6 dB improvement in signal over previous heads without sacrificing Barkhausen-noise free operation in narrow trackwidths. © 1990 IEEE

引用

页码：2412 / 2414

页数：3

共 3 条

[1] DUAL EXCHANGE BIASED NIFE-TBCO UNSHIELDED MR HEADS FOR HIGH-DENSITY RECORDING [J].

CAIN, WC ;

MARKHAM, DC ;

KRYDER, MH .

IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (05) :3695-3697

[2] EFFECTS OF TEMPERATURE ON EXCHANGE COUPLED ALLOYS OF NI80FE20-FEMN, NI80FE20-ALPHA-FE2O3, AND NI80FE20-TBCO [J].

CAIN, WC ;

MEIKLEJOHN, WH ;

KRYDER, MH .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (08) :4170-4172

[3] MICROMAGNETIC ANALYSIS OF A COUPLED THIN-FILM SELF-BIASED MAGNETORESISTIVE SENSOR [J].

SMITH, N .

IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (01) :259-272

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