IN-SITU MONITORING OF ELECTRODE SURFACE MODIFICATION VIA CONFOCAL SCANNING BEAM LASER MICROSCOPY

被引：15

作者：

GU, ZH ^{[1
]}

FAHIDY, TZ ^{[1
]}

DAMASKINOS, S ^{[1
]}

DIXON, AE ^{[1
]}

机构：

[1] UNIV WATERLOO,DEPT PHYS,WATERLOO N2L 3G1,ONTARIO,CANADA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1994年 / 141卷 / 11期

关键词：

electrodes; microscopy laser beam applications; monitoring; surface morphology; surface treatment;

D O I：

10.1149/1.2059326

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

A new approach is presented for the monitoring of surface modification during the oxidation or reduction of metals in electrode reactions. This nonintrusive technique is based on the combination of confocal scanning beam laser microscopy and electrochemical measurements, and it allows an in situ characterization of 3-D surface morphology on a micrometric scale.

引用

页码：L153 / L155

页数：3