A SYSTEM FOR ONE-DIMENSIONAL AND TWO-DIMENSIONAL SIGNAL PROCESSING FOR X-RAY-SCATTERING, TUNNELING AND ATOMIC FORCE MICROSCOPY APPLICATIONS

被引:2
作者
HALLING, H
MOELLER, R
SCHUMMERS, A
机构
关键词
D O I
10.1109/23.34515
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:634 / 637
页数:4
相关论文
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