FOURIER-TRANSFORM PHOTOELECTRON-SPECTROSCOPY

被引：5

作者：

MUEHLHOFF, L ^{[1
]}

MUEHLHOFF, HM ^{[1
]}

机构：

[1] ASSMUTH & MUEHLHOFF CO,WILKINSBURG,PA 15221

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期

关键词：

D O I：

10.1116/1.573501

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1540 / 1544

页数：5

共 14 条

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ORCHARD, AF .

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[2]

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GROBMAN, WD .

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[4]

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[5] DECONVOLUTION IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

KOENIG, MF ;

GRANT, JT .

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[6]

NOELLER HG, 1974, J ELECTRON SPECTROSC, V5, P705

[7] COMBINED ESCA-AUGER SYSTEM BASED ON DOUBLE PASS CYLINDRICAL MIRROR ANALYZER [J].

PALMBERG, PW .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :691-703

[8] SPHERICAL ANALYZER WITH PRE-RETARDATION [J].

POLASCHEGG, HD .

APPLIED PHYSICS, 1974, 4 (01) :63-68

[9] The focusing of charged particles by a spherical condenser [J].

Purcell, EM .

PHYSICAL REVIEW, 1938, 54 (10) :818-826

[10]

ROWE HE, 1965, SIGNAL NOISE COMMUNI

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