GENETIC-ANALYSIS OF RESISTANCE TO BACTERIAL LEAF STREAK CAUSED BY XANTHOMONAS-CAMPESTRIS PV UNDULOSA IN BREAD WHEAT

被引:37
作者
DUVEILLER, E [1 ]
VANGINKEL, M [1 ]
THIJSSEN, M [1 ]
机构
[1] AGR UNIV WAGENINGEN, DEPT PLANT BREEDING IVP, 6700 AJ WAGENINGEN, NETHERLANDS
关键词
BLACK CHAFF; TRITICUM-AESTIVUM; XANTHOMONAS-TRANSLUCENS; INHERITANCE; RESISTANCE; BACTERIAL STRIPE; WHEAT;
D O I
10.1007/BF00023506
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
The inheritance of resistance to bacterial leaf streak or black chaff of wheat was studied under field conditions, with an artificial epidemic of Xanthomonas campestris pv. undulosa. A complete series of crosses between five parents, differing in reaction to X. c. pv. undulosa, was generated. Disease was recorded at two different stages of growth. No evidence of cytoplasmic effect was found from the comparison between reciprocal F1 crosses. The study of the F3 generations attested that five genes were involved in resistance to bacterial leaf streak. Separate analyses carried out for the two scoring dates were mutually consistent: genotypes, number of genes, and their action and relative importance were verified. The genes differed in strength of expression of resistance. One of the two strongest genes, Bls1, is present in all three superior parents, Pavon 76, Mochis T88 and Angostura F88. Resistance was not complete, and proved to be stable over the season.
引用
收藏
页码:35 / 43
页数:9
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