AZIMUTHAL DEPENDENCE OF ANGLE RESOLVED PHOTOELECTRON DIFFRACTION FROM I ON AG(111) - MULTIPLE-SCATTERING ANALYSIS TO DETERMINE THE ADSORPTION SITE

被引：29

作者：

KANG, WM ^{[1
]}

LI, CH ^{[1
]}

TONG, SY ^{[1
]}

机构：

[1] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201

来源：

SOLID STATE COMMUNICATIONS | 1980年 / 36卷 / 02期

关键词：

D O I：

10.1016/0038-1098(80)90671-7

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：149 / 154

页数：6

共 14 条

[1] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111)
CITRIN, PH
EISENBERGER, P
HEWITT, RC
[J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312
[2] FARRELL HH, UNPUBLISHED
[3] DETERMINATION OF ADSORPTION SITE BY LOW-ENERGY ELECTRON-DIFFRACTION FOR IODINE ON SILVER (111)
FORSTMANN, F
BERNDT, W
BUTTNER, P
[J]. PHYSICAL REVIEW LETTERS, 1973, 30 (01) : 17 - 19
[4] KANG WM, UNPUBLISHED
[5] NORMAL PHOTOELECTRON DIFFRACTION OF SE 3D LEVEL IN SE OVERLAYERS ON NI(100)
KEVAN, SD
ROSENBLATT, DH
DENLEY, D
LU, BC
SHIRLEY, DA
[J]. PHYSICAL REVIEW LETTERS, 1978, 41 (22) : 1565 - 1568
[6] BINDING-SITE DETERMINATION FROM ANGLE-RESOLVED ULTRAVIOLET PHOTOEMISSION INTENSITY MODULATIONS - CLASSIFICATION OF INITIAL STATES INTO 2 TYPES
LI, CH
TONG, SY
[J]. PHYSICAL REVIEW LETTERS, 1979, 42 (14) : 901 - 904
[7] MULTIPLE-SCATTERING APPROACH TO ANGLE-RESOLVED PHOTOEMISSION
LI, CH
LUBINSKY, AR
TONG, SY
[J]. PHYSICAL REVIEW B, 1978, 17 (08): : 3128 - 3142
[8] ANALYSIS OF RESONANCE LIKE PEAKS IN ANGLE-RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY FROM ABSORBED ATOMS
LI, CH
TONG, SY
[J]. PHYSICAL REVIEW B, 1979, 19 (04): : 1769 - 1773
[9] PHOTOELECTRON DIFFRACTION EFFECTS IN CORE-LEVEL PHOTOEMISSION FROM NA AND TE ATOMS ADSORBED ON NI(001)
SMITH, NV
FARRELL, HH
TRAUM, MM
WOODRUFF, DP
NORMAN, D
WOOLFSON, MS
HOLLAND, BW
[J]. PHYSICAL REVIEW B, 1980, 21 (08): : 3119 - 3130
[10] DYNAMICAL CALCULATIONS OF LOW-ENERGY ELECTRON-DIFFRACTION FOR INCOMMENSURATE LATTICE STRUCTURES - XE ON AG(111)
STONER, N
VANHOVE, MA
TONG, SY
WEBB, MB
[J]. PHYSICAL REVIEW LETTERS, 1978, 40 (04) : 243 - 246

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