PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2

被引:218
作者
DISTEFANO, TH
EASTMAN, DE
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D O I
10.1103/PhysRevLett.27.1560
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O4 [物理学];
学科分类号
0702 ;
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页码:1560 / +
页数:1
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[1]   PROPERTIES OF VITREOUS SILICA - ANALYSIS OF RANDOM NETWORK MODELS [J].
BELL, RJ ;
DEAN, P .
NATURE, 1966, 212 (5068) :1354-&
[2]  
DISTEFANO TH, TO BE PUBLISHED
[3]  
DISTEFANO TH, 1970, B AM PHYS SOC, V16, P373
[4]   PHOTOEMISSION FROM CU, AG, AND AU IN 10- TO 27-EV ENERGY RANGE [J].
EASTMAN, DE ;
CASHION, JK .
PHYSICAL REVIEW LETTERS, 1970, 24 (07) :310-&
[5]  
FISCHER W, 1970, ADVANCES XRAY ANALYS, V13, P159
[6]   ULTRAVIOLET REFLECTANCE OF AL2O3, SIO2 AND BEO [J].
LOH, E .
SOLID STATE COMMUNICATIONS, 1964, 2 (09) :269-272
[7]  
MOORE CE, 1958, NBS467 CIRC WASH, V3
[8]  
NAGEL DJ, 1970, ADV XRAY ANAL, V13, P182
[9]   OPTICAL TRANSITIONS IN CRYSTALLINE AND FUSED QUARTZ [J].
PHILIPP, HR .
SOLID STATE COMMUNICATIONS, 1966, 4 (01) :73-&