INDIRECT METHOD FOR SEQUENTIAL DETERMINATION OF SILICON AND PHOSPHORUS IN ROCK ANALYSIS BY ATOMIC-ABSORPTION SPECTROMETRY - COMMENT

被引:1
作者
ABBEY, S
MAXWELL, JA
机构
[1] Geological Survey of Canada, Ottawa
关键词
D O I
10.1016/S0003-2670(01)83587-X
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
[No abstract available]
引用
收藏
页码:397 / 398
页数:2
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[1]   INDIRECT METHOD FOR SEQUENTIAL DETERMINATION OF SILICON AND PHOSPHORUS IN ROCK ANALYSIS BY ATOMIC-ABSORPTION SPECTROMETRY [J].
RIDDLE, C ;
TUREK, A .
ANALYTICA CHIMICA ACTA, 1977, 92 (01) :49-53