PROJECTED INTERFERENCE FRINGES IN HOLOGRAPHIC INTERFEROMETRY

被引:10
作者
ROWE, SH
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D O I
10.1364/JOSA.61.001599
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:1599 / &
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共 10 条
[1]  
BOONE P, 1969, OPT ACTA, V16, P555, DOI 10.1080/713818208
[2]   APPLICATION OF MOIRE TECHNIQUES TO HOLOGRAPHY (LASER LIGHT STRAIN SURFACE STUDIES DIFFRACTION INTERFEROMETRY E/T) [J].
COLLIER, RJ ;
DOHERTY, ET ;
PENNINGTON, KS .
APPLIED PHYSICS LETTERS, 1965, 7 (08) :223-+
[3]   MEASUREMENT OF IN-PLANE SURFACE STRAIN BY HOLOGRAM INTERFEROMETRY [J].
ENNOS, AE .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07) :731-&
[4]  
Lord Rayleigh, 1874, PHILOS MAG, V47, P193
[5]  
Rayleigh L, 1874, PHILOS MAG, V47, P81
[6]   SURFACE TOPOGRAPHY OF NON-OPTICAL SURFACES BY PROJECTED INTERFERENCE FRINGES [J].
ROWE, SH ;
WELFORD, WT .
NATURE, 1967, 216 (5117) :786-&
[7]   OPTICAL AND PHOTOELECTRIC ANALOG OF THE EYE [J].
SCHADE, OH .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (09) :721-739
[8]  
STETSON KA, 1970, OPTIK, V31, P576
[9]   DESENSITIZED HOLOGRAM INTERFEROMETRY [J].
VARNER, JR .
APPLIED OPTICS, 1970, 9 (09) :2098-&
[10]  
WELFORD WT, 1969, OPT ACTA, V16, P371, DOI 10.1080/713818180