COMPLEXITY OF THE MAGNETIC-FIELD-INDUCED CROSS-OVER INSTABILITY OF A FILAMENTARY CURRENT IN N-GAAS

被引：3

作者：

AOKI, K

KONDO, T

机构：

[1] Department of Electrical Engineering, Faculty of Engineering, Kobe University, Kobe, 657, Rokkodai, Nada

来源：

PHYSICS LETTERS A | 1991年 / 154卷 / 5-6期

关键词：

D O I：

10.1016/0375-9601(91)90821-O

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The complex behavior of the magnetic-field-induced cross-over instability of a filamentary current formed by an impact ionization process has been investigated in high-purity n-GaAs at 4.2 K. By applying a longitudinal magnetic field B, the holding voltage of the current filament shifts toward a higher voltage and crosses over the breakdown voltage with B greater-than-or-similar-to B(c) (B(c) ranged from 25 to 47 mT). Three types of cross-over instability are classified and discussed by using the doubly S-shaped current-voltage characteristics deduced from a physical model. The various nature of the cross-over instability is attributed to geometric effects of the current filament. A mathematical model is presented to demonstrate the generalized cross-over instability.

引用

页码：281 / 286

页数：6