MEASURING THE THICKNESS OF VERY THIN MICROTOME SECTIONS

[1] ELVERS I, 1943, ACTA HORTI BERGIANI, V13, P149

[2] A HIGH SPEED MICROTOME FOR THE ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (01) : 23 - 35

[3] O'Brien H. C, 1943, SCIENCE, V98, P455, DOI 10.1126/science.98.2551.455

[4] PEASE DC, 1948, P SOC EXP BIOL MED, V67, P470

[5] THE ELLIPSOMETER, AN APPARATUS TO MEASURE THICKNESSES OF THIN SURFACE FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (02) : 26 - 30

[6] Sjostrand Fritiof, 1944, ARKIV ZOOL [STOCKHOLM], V35A, P1

[7] VONARDENNE M, 1939, Z WISS MIKROSK, V56, P8

[8] OPTICAL DETERMINATION OF THIN FILMS ON REFLECTING BASES IN TRANSPARENT ENVIRONMENTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1948, 38 (12) : 1074 - 1082

[1] ELVERS I, 1943, ACTA HORTI BERGIANI, V13, P149

[2] A HIGH SPEED MICROTOME FOR THE ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (01) : 23 - 35

[3] O'Brien H. C, 1943, SCIENCE, V98, P455, DOI 10.1126/science.98.2551.455

[4] PEASE DC, 1948, P SOC EXP BIOL MED, V67, P470

[5] THE ELLIPSOMETER, AN APPARATUS TO MEASURE THICKNESSES OF THIN SURFACE FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (02) : 26 - 30

[6] Sjostrand Fritiof, 1944, ARKIV ZOOL [STOCKHOLM], V35A, P1

[7] VONARDENNE M, 1939, Z WISS MIKROSK, V56, P8

[8] OPTICAL DETERMINATION OF THIN FILMS ON REFLECTING BASES IN TRANSPARENT ENVIRONMENTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1948, 38 (12) : 1074 - 1082