FAST NEUTRON DAMAGE AND CURRENT CARRYING CAPACITY OF NIOBIUM NITRIDE

被引：12

作者：

SADAGOPAN, V

GATOS, HC

HECHLER, K

SAUR, E

机构：

[1] Department of Metallurgy and Materials Science and Department of Electrical Engineering, Massachusetts Institute of Technology, Cambridge, 02139, Massachusetts

[2] Institut für Angewandte Physik der Universität Gießen, Gießen

来源：

ZEITSCHRIFT FUR PHYSIK | 1969年 / 225卷 / 03期

关键词：

D O I：

10.1007/BF01392217

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Niobium nitride samples were irradiated with fast neutrons to a total dosage of 3.7×1019 NVT. The current carrying capacity of the samples before and after irradiation was determined. Significant enhancement of the current carrying capacity of the samples was found to result from irradiation (particularly in the 30-80 kGauss range) apparently due to neutron-induced defects acting as pinning centers for the fluxons. © 1969 Springer-Verlag.

引用

页码：231 / +

页数：1

共 14 条

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