2-SIGNAL METHOD OF MEASURING LARGE-SIGNAL S-PARAMETERS OF TRANSISTORS

被引:25
作者
MAZUMDER, SR [1 ]
VANDERPUIJE, PD [1 ]
机构
[1] CARLETON UNIV,DEPT ELECTR,OTTAWA K1S 5B6,ONTARIO,CANADA
关键词
D O I
10.1109/TMTT.1978.1129404
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:417 / 420
页数:4
相关论文
共 11 条
[1]  
CHAFFIN RJ, 1973, DIGEST TECH
[2]  
HOUSELANDER LS, 1970, IEEE J SOLID STA APR
[3]  
KUROKAWA K, 1965, IEEE T MICROWAVE MAR
[4]  
LEIGHTON WH, 1973, IEEE T MICROWAVE THE, V21
[5]   EXPERIMENTAL-METHOD OF CHARACTERIZING NONLINEAR 2-PORTS AND ITS APPLICATION TO MICROWAVE CLASS-C TRANSISTOR POWER-AMPLIFIER DESIGN [J].
MAZUMDER, SR ;
VANDERPUIJE, PD .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) :576-580
[6]   CHARACTERIZATION OF NONLINEAR 2-PORTS FOR DESIGN OF CLASS-C AMPLIFIERS [J].
MAZUMDER, SR ;
VANDERPUIJE, PD .
IEE JOURNAL ON MICROWAVES OPTICS AND ACOUSTICS, 1977, 1 (04) :138-142
[7]  
MAZUMDER SR, 1976, THESIS CARLETON U
[8]  
MULLER O, 1968, NACHRICHTENTECH OCT
[9]  
SAAL R, 1958, IRE T CIRCUIT THEORY, P284
[10]  
TAKAYAMA Y, 1976, DIG IEEE MIT S 76, P218