THE GE-SI BOND IN SILYLGERMANE - DISCREPANCY BETWEEN EXPERIMENT AND THEORY

被引：14

作者：

OBERHAMMER, H ^{[1
]}

LOBREYER, T ^{[1
]}

SUNDERMEYER, W ^{[1
]}

机构：

[1] UNIV HEIDELBERG,INST ANORGAN CHEM,D-69120 HEIDELBERG,GERMANY

来源：

JOURNAL OF MOLECULAR STRUCTURE | 1994年 / 323卷

关键词：

D O I：

10.1016/0022-2860(94)07992-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The gas-phase structure of H3Ge-SiH3 was determined by joint analysis of electron diffraction intensities and the rotational constant. The following geometric parameters (r(a) distances and angle(alpha) angles with 2sigma uncertainties) were obtained: Ge-Si = 2.364(l), Ge-H = 1.538(3), Si-H = 1.494(6) angstrom, HGeH = HSiH = 108.8(3)-degrees. The experimental Ge-Si bond length is 0.04-0.07 angstrom shorter than various ab initio results reported in the literature.

引用

页码：125 / 128

页数：4

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