SYMMETRY, STRUCTURE, AND STEP INDUCED ORDERING OF THE SI(001)-(2X3)AG SURFACE

被引:33
作者
MICHELY, T [1 ]
REUTER, MC [1 ]
COPEL, M [1 ]
TROMP, RM [1 ]
机构
[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST GRENZFLACHENFORSCH & VAKUUMPHYS, D-52425 JULICH, GERMANY
关键词
D O I
10.1103/PhysRevLett.73.2095
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The formation of the Si(001)-(2 X 3)Ag structure has been studied by low energy electron microscopy. The lack of mirror symmetry within the (2 x 3) unit cell in the period doubled direction gives rise to the formation of two overlayer domain types on each terrace, which dynamically order with respect to step edges. We show that an anisotropic step-domain interaction energy explains the observations. Based on a quantitative determination of the number of Ag and Si atoms in the unit cell a structure model is suggested.
引用
收藏
页码:2095 / 2098
页数:4
相关论文
共 7 条
[1]   SURFACE RECONSTRUCTIONS IN THE AG/SI(001) SYSTEM [J].
LIN, XF ;
WAN, KJ ;
NOGAMI, J .
PHYSICAL REVIEW B, 1994, 49 (11) :7385-7393
[2]   A LOW-ENERGY ELECTRON-MICROSCOPY STUDY OF THE SYSTEM SI(111)-AU [J].
SWIECH, W ;
BAUER, E ;
MUNDSCHAU, M .
SURFACE SCIENCE, 1991, 253 (1-3) :283-296
[3]   AN ANALYTICAL REFLECTION AND EMISSION UHV SURFACE ELECTRON-MICROSCOPE [J].
TELIEPS, W ;
BAUER, E .
ULTRAMICROSCOPY, 1985, 17 (01) :57-65
[4]  
TELIEPS W, 1985, SURF SCI, V162, P153
[5]   IMAGING WITH A LOW-ENERGY-ELECTRON MICROSCOPE [J].
TROMP, RM ;
REUTER, MC .
ULTRAMICROSCOPY, 1993, 50 (02) :171-178
[6]   DESIGN OF A NEW PHOTOEMISSION LOW-ENERGY ELECTRON-MICROSCOPE FOR SURFACE STUDIES [J].
TROMP, RM ;
REUTER, MC .
ULTRAMICROSCOPY, 1991, 36 (1-3) :99-106
[7]   RECONSTRUCTIONS AND GROWTH OF AG ON SI(001)(2X1) [J].
WINAU, D ;
ITOH, H ;
SCHMID, AK ;
ICHINOKAWA, T .
SURFACE SCIENCE, 1994, 303 (1-2) :139-145