TRANSVERSE ELECTRON FOCUSING AND SPECULAR REFLECTION IN SILVER

被引：25

作者：

TSOI, VS ^{[1
]}

BASS, J ^{[1
]}

BENISTANT, PAM ^{[1
]}

VANKEMPEN, H ^{[1
]}

PAYENS, ELM ^{[1
]}

WYDER, P ^{[1
]}

机构：

[1] CATHOLIC UNIV NIJMEGEN,MAT RES INST,NIJMEGEN,NETHERLANDS

来源：

JOURNAL OF PHYSICS F-METAL PHYSICS | 1979年 / 9卷 / 11期

关键词：

D O I：

10.1088/0305-4608/9/11/004

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Transverse electron focusing (TEF) has been observed in Ag and used to estimate the probability, q, of specular reflection, of belly-orbit electrons incident normally onto the (100) and (110) crystal faces. For the (100) face, q=0.7+or-0.1, and for the (110) face, q=0.6+or-0.1.

引用

页码：L221 / L226

页数：6