HIGH-TEMPERATURE STABILITY OF A SPECTRAL HOLE BURNT IN SM-DOPED SRFCL CRYSTALS

被引：63

作者：

ZHANG, JH

HUANG, SH

YU, JQ

机构：

[1] Changchun Institute of Physics, Academia Sinica, Changchun

来源：

OPTICS LETTERS | 1992年 / 17卷 / 16期

关键词：

D O I：

10.1364/OL.17.001146

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A long-lived spectral hole at high temperature is observed in SrFCl:Sm. The measured hole lifetimes at 292 and 315 K are approximately 14 days and 16 h, respectively. Thermally induced hole filling is studied by using the time-decay experimental data of the hole area at different temperatures and by assuming a thermally activated process. An average thermal activation energy of 1.2 eV needed for hole filling is deduced.

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页码：1146 / 1148

页数：3

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