CORRECTION OF THE SELF-ABSORPTION EFFECT IN FLUORESCENCE X-RAY-ABSORPTION FINE-STRUCTURE

The X-ray absorption fine structure (XAFS) measured with the X-ray fluorescence yield strongly depends on the concentration, thickness and detection geometry resulting from the self-absorption eff ect. A correction procedure for the self-absorption effect is presented using a simple theory of X-ray fluorescence yield and applied to X-ray absorption near-edge structure (XANES) of a thin iron foil and an iron compound. The accuracy of the self-absorption correction is discussed.