A MICROPROCESSOR-CONTROLLED CONTINUOUS-FLOW CRYOSTAT FOR SINGLE-CRYSTAL X-RAY-DIFFRACTION IN THE RANGE 10-300 K

[1] LIQUID-HELIUM CRYOSTAT FOR COLLECTION OF 3-DIMENSIONAL X-RAY-INTENSITY DATA DOWN TO 20-K - CRYSTAL-STRUCTURE OF D(+)-TARTARIC ACID AT 35, 105, 160 AND 295K [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (DEC) : 537 - 544

[2] PHOTOGRAPHING RECIPROCAL LATTICE WITH AXIS OF FILM CYLINDER INTERSECTING ROTATION AXIS OF CRYSTAL AT 45DEGREES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (JUN1) : 156 - 166

[3] AUTOMATIC SYSTEM FOR X-RAY STUDIES OF PHASE-TRANSITIONS AT LOW-TEMPERATURES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (DEC1) : 481 - 484

[4] COPPENS P, 1974, J APPL CRYSTALLOGR, V7, P315, DOI [10.1107/S0021889874009745, 10.1107/S0021889874010259]

[5] MICROPROCESSOR CONTROL OF HIGH-TEMPERATURE X-RAY-DIFFRACTION EXPERIMENTS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (02): : 170 - 174

[6] EFFICIENT FLOW CRYOSTAT FOR USE BETWEEN 3.5 AND 300K [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (09): : 868 - 870

[7] WINDOWS FOR X-RAY-DIFFRACTION EXPERIMENTS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (01) : 71 - 74

[8] TECHNIQUE FOR AUTOMATIC RECORDING OF PHASE-TRANSITIONS IN SINGLE-CRYSTALS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (DEC1) : 420 - &

[9] HELIUM TEMPERATURES IN A 4-CIRCLE NEUTRON DIFFRACTOMETER [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) : 18 - 20

[10] A LOW-TEMPERATURE WEISSENBERG CAMERA FOR NEUTRONS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1981, 14 (APR) : 82 - 84

[1] LIQUID-HELIUM CRYOSTAT FOR COLLECTION OF 3-DIMENSIONAL X-RAY-INTENSITY DATA DOWN TO 20-K - CRYSTAL-STRUCTURE OF D(+)-TARTARIC ACID AT 35, 105, 160 AND 295K [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (DEC) : 537 - 544

[2] PHOTOGRAPHING RECIPROCAL LATTICE WITH AXIS OF FILM CYLINDER INTERSECTING ROTATION AXIS OF CRYSTAL AT 45DEGREES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (JUN1) : 156 - 166

[3] AUTOMATIC SYSTEM FOR X-RAY STUDIES OF PHASE-TRANSITIONS AT LOW-TEMPERATURES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (DEC1) : 481 - 484

[4] COPPENS P, 1974, J APPL CRYSTALLOGR, V7, P315, DOI [10.1107/S0021889874009745, 10.1107/S0021889874010259]

[5] MICROPROCESSOR CONTROL OF HIGH-TEMPERATURE X-RAY-DIFFRACTION EXPERIMENTS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (02): : 170 - 174

[6] EFFICIENT FLOW CRYOSTAT FOR USE BETWEEN 3.5 AND 300K [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (09): : 868 - 870

[7] WINDOWS FOR X-RAY-DIFFRACTION EXPERIMENTS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (01) : 71 - 74

[8] TECHNIQUE FOR AUTOMATIC RECORDING OF PHASE-TRANSITIONS IN SINGLE-CRYSTALS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (DEC1) : 420 - &

[9] HELIUM TEMPERATURES IN A 4-CIRCLE NEUTRON DIFFRACTOMETER [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) : 18 - 20

[10] A LOW-TEMPERATURE WEISSENBERG CAMERA FOR NEUTRONS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1981, 14 (APR) : 82 - 84