A NEW OFF-AXIS FRESNEL HOLOGRAPHIC METHOD IN TRANSMISSION ELECTRON-MICROSCOPY - AN APPLICATION ON THE MAPPING OF FERROMAGNETIC DOMAINS .3.

被引：17

作者：

MATTEUCCI, G ^{[1
]}

MISSIROLI, GF ^{[1
]}

POZZI, G ^{[1
]}

机构：

[1] UNIV BOLOGNA,MICROSCOPIA ELETTRON LAB,I-40126 BOLOGNA,ITALY

来源：

关键词：

D O I：

10.1016/0304-3991(82)90063-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：403 / 408

页数：6

共 15 条

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[2] HANSZEN KJ, 1980, ELECTRON MICROSCOPY, V1, P136
[3] HANSZEN KJ, 1980, ELECTRON MICROSCOPY, V1, P140
[4] LAU B, 1978, OPTIK, V51, P287
[5] HOLOGRAPHY WITH ACHROMATIC-FRINGE SYSTEMS
LEITH, EN
UPATNIEK.J
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (08) : 975 - +
[6] ELECTRON INTERFEROMETER
MARTON, L
[J]. PHYSICAL REVIEW, 1952, 85 (06): : 1057 - 1058
[7] MATTEUCCI G, 1981, ULTRAMICROSCOPY, V6, P109, DOI 10.1016/0304-3991(81)90050-4
[8] MATTEUCCI G, 1981, ULTRAMICROSCOPY, V7, P295
[9] ELECTRON INTERFEROMETRY AND INTERFERENCE ELECTRON-MICROSCOPY
MISSIROLI, GF
POZZI, G
VALDRE, U
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (06): : 649 - 671
[10] DIRECT OBSERVATION OF FINE-STRUCTURE OF MAGNETIC DOMAIN-WALLS BY ELECTRON HOLOGRAPHY
TONOMURA, A
MATSUDA, T
ENDO, J
ARII, T
MIHAMA, K
[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (21) : 1430 - 1433