GENERALIZATION OF TSD NETWORK-ANALYZER CALIBRATION PROCEDURE, COVERING N-PORT SCATTERING-PARAMETER MEASUREMENTS, AFFECTED BY LEAKAGE ERRORS

被引：85

作者：

SPECIALE, RA

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1977年 / 25卷 / 12期

关键词：

D O I：

10.1109/TMTT.1977.1129282

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1100 / 1115

页数：16

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