PENETRATION DEPTH MEASUREMENTS ON TYPE-2 SUPERCONDUCTING FILMS

被引：101

作者：

HENKELS, WH ^{[1
]}

KIRCHER, CJ ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1977年 / 13卷 / 01期

关键词：

D O I：

10.1109/TMAG.1977.1059426

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：63 / 66

页数：4

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