OPTICAL EMISSION SPECTROCHEMICAL ANALYSIS

[1] AVNI R, 1972, APPL SPECTROSC, V26, P641

[2] LIQUID-LAYER ON SOLID-SAMPLE SPARK TECHNIQUE FOR EMISSION SPECTROCHEMICAL ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (01) : 66 - 72

[3] BAUDIN G, 1976, CEACONF82 CTR ET NUC

[4] IN-DEPTH COMPOSITIONAL PROFILE ANALYSIS OF ALLOYS USING OPTICAL EMISSION GLOW-DISCHARGE SPECTROGRAPHY [J]. APPLIED SPECTROSCOPY, 1973, 27 (02) : 118 - 124

[5] BERNERON R, 1975, 18 P C SPECTR INT GR, V1, P263

[6] BEUCK O, 1973, C SPECTROSC INT FLOR, V1, P258

[7] BOUMANS PWJ, 1973, SPECTROCHIM ACTA B, VB 28, P227, DOI 10.1016/0584-8547(73)80030-8

[8] BOUMANS PWJ, 1976, SPECTROCHIM ACTA B, V31, P179

[9] DIRECT-CURRENT (CENTRAL PLASMA REGION) SPECTROCHEMICAL ANALYSIS OF STANDARD SILICATE ROCKS AND MINERALS [J]. APPLIED SPECTROSCOPY, 1975, 29 (01) : 82 - 85

[10] BUBERT H, 1976, 11 SPEKTR MONTR, P9

[1] AVNI R, 1972, APPL SPECTROSC, V26, P641

[2] LIQUID-LAYER ON SOLID-SAMPLE SPARK TECHNIQUE FOR EMISSION SPECTROCHEMICAL ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (01) : 66 - 72

[3] BAUDIN G, 1976, CEACONF82 CTR ET NUC

[4] IN-DEPTH COMPOSITIONAL PROFILE ANALYSIS OF ALLOYS USING OPTICAL EMISSION GLOW-DISCHARGE SPECTROGRAPHY [J]. APPLIED SPECTROSCOPY, 1973, 27 (02) : 118 - 124

[5] BERNERON R, 1975, 18 P C SPECTR INT GR, V1, P263

[6] BEUCK O, 1973, C SPECTROSC INT FLOR, V1, P258

[7] BOUMANS PWJ, 1973, SPECTROCHIM ACTA B, VB 28, P227, DOI 10.1016/0584-8547(73)80030-8

[8] BOUMANS PWJ, 1976, SPECTROCHIM ACTA B, V31, P179

[9] DIRECT-CURRENT (CENTRAL PLASMA REGION) SPECTROCHEMICAL ANALYSIS OF STANDARD SILICATE ROCKS AND MINERALS [J]. APPLIED SPECTROSCOPY, 1975, 29 (01) : 82 - 85

[10] BUBERT H, 1976, 11 SPEKTR MONTR, P9