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LOW-TEMPERATURE, SMALL-SAMPLE REFLECTIVITY MEASUREMENTS IN A COMMERCIAL RAPID-SCAN MICHELSON INTERFEROMETER

被引：17
作者：
ELDRIDGE, JE
HOMES, CC
机构：
来源：
INFRARED PHYSICS | 1989年 / 29卷 / 01期
关键词：
D O I：
10.1016/0020-0891(89)90016-X
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：143 / 148
页数：6
相关论文
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