STUDIES ON ATOMIC SPECTROSCOPIC TRACE ANALYSIS IN SMALL SAMPLES OF A(III)B(V) SEMICONDUCTORS .4. COMPARISON OF DETERMINATION OF TRACE TELLURIUM IN GAP AND GAAS BY AAS, AFS AND AES

被引:6
作者
DITTRICH, K
VOGEL, H
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D O I
10.1016/0039-9140(79)80180-0
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O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:737 / 740
页数:4
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