SINGLE-CRYSTAL DIFFRACTOMETRY - IMPROVEMENT OF ACCURACY IN INTENSITY MEASUREMENTS

被引：99

作者：

ALEXANDER, LE

SMITH, GS

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1964年 / 17卷 / 10期

关键词：

D O I：

10.1107/S0365110X64003115

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1195 / &

共 12 条

[1] DETERMINATION OF INHERENT REFLECTING RANGE OF A SINGLE CRYSTAL IN DIFFRACTOMETRY
ALEXANDER, LE
BROWN, PE
SMITH, GS
[J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (08): : 773 - &
[2] RECEIVING APERTURE WIDTHS IN SINGLE-CRYSTAL DIFFRACTOMETRY
ALEXANDER, LE
SMITH, GS
[J]. ACTA CRYSTALLOGRAPHICA, 1964, 17 (04): : 447 - &
[3] SINGLE-CRYSTAL INTENSITY MEASUREMENTS WITH 3-CIRCLE COUNTER DIFFRACTOMETER
ALEXANDER, LE
SMITH, GS
[J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (OCT): : 983 - &
[4] COMPARISON OF OMEGA + 2THETA SCANS FOR INTEGRATED INTENSITY MEASUREMENT
BURBANK, RD
[J]. ACTA CRYSTALLOGRAPHICA, 1964, 17 (04): : 434 - &
[5] FISCHER K, 1961, Z KRISTALLOGR, V116, P27
[6] APPARATUS FOR MEASURING COMPLETE SINGLE-CRYSTAL X-RAY DIFFRACTION DATA BY MEANS OF A GEIGER COUNTER DIFFRACTOMETER
FURNAS, TC
HARKER, D
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (05) : 449 - 453
[7] FURNAS TC, 1957, SINGLE CRYSTAL ORIEN
[8] KLUG HP, 1954, XRAY DIFFRACTION PRO
[9] A new method of spectroscopy for faint x-radiations
Ross, PA
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1928, 16 (06): : 433 - 437
[10] VERSCHOOR AC, 1963, PRIVATE COMMUNICATIO