SCANNING POSITRON MICROBEAM

被引:41
作者
BRANDES, GR [1 ]
CANTER, KF [1 ]
HORSKY, TN [1 ]
LIPPEL, PH [1 ]
MILLS, AP [1 ]
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
关键词
D O I
10.1063/1.1140231
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:228 / 232
页数:5
相关论文
共 30 条
  • [1] SPUTTERING DAMAGE IN MO(111) STUDIED WITH SLOW POSITRONS AND COMPUTER-SIMULATIONS
    BENTZON, MD
    HUOMO, H
    VEHANEN, A
    HAUTOJARVI, P
    LAHTINEN, J
    HAUTALA, M
    [J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1987, 17 (07): : 1477 - 1490
  • [2] Berko S., 1981, POSITRON SOLID STATE, P64
  • [3] Bevington P R, 1969, DATA REDUCTION ERROR, P222
  • [4] POSITRON IMPLANTATION-PROFILE EFFECTS IN SOLIDS
    BRANDT, W
    PAULIN, R
    [J]. PHYSICAL REVIEW B, 1977, 15 (05): : 2511 - 2518
  • [5] Canter K. F., 1986, Positron Studies of Solids, Surfaces, and Atoms. A Symposium to celebrate Stephan Berko's 60th Birthday, P102
  • [6] SLOW POSITRON BEAM DESIGN NOTES
    CANTER, KF
    MILLS, AP
    [J]. CANADIAN JOURNAL OF PHYSICS, 1982, 60 (04) : 551 - 557
  • [7] MEASUREMENT OF TOTAL CROSS-SECTIONS FOR LOW-ENERGY POSITRON-HELIUM COLLISIONS
    CANTER, KF
    GRIFFITH, TC
    HEYLAND, GR
    COLEMAN, PG
    [J]. JOURNAL OF PHYSICS PART B ATOMIC AND MOLECULAR PHYSICS, 1972, 5 (08): : L167 - &
  • [8] CANTER KF, 1985, POSITRON ELECTRON GA, P202
  • [9] MEASUREMENT OF POSITRON REEMISSION FROM THIN SINGLE-CRYSTAL W(100) FILMS
    CHEN, DM
    LYNN, KG
    PAREJA, R
    NIELSEN, B
    [J]. PHYSICAL REVIEW B, 1985, 31 (07): : 4123 - 4130
  • [10] COLEMAN CF, 1982, POSITRON ANNIHILATIO, P871