THE CHARACTERIZATION OF AN IMAGING TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY INSTRUMENT

被引：49

作者：

ECCLES, AJ ^{[1
]}

VICKERMAN, JC ^{[1
]}

机构：

[1] UNIV MANCHESTER,INST SCI & TECHNOL,SURFACE ANAL RES CTR,MANCHESTER M60 1QD,LANCS,ENGLAND

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 02期

关键词：

D O I：

10.1116/1.576125

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：234 / 244

页数：11

共 17 条

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