ATOMIC-FORCE MICROSCOPE STUDY OF THIN-PLATE MARTENSITES IN AN FE-NI-C ALLOY

被引：20

作者：

YAMAMOTO, M

NISHIKAWA, K

NODA, Y

SABURI, T

HAYAKAWA, M

OKA, M

KURUMIZAWA, T

机构：

[1] TOTTORI UNIV,DEPT MECH ENGN,TOTTORI 680,JAPAN

[2] MATSUSHITA TECHNORES INC,MORIGUCHI,OSAKA 570,JAPAN

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期

关键词：

D O I：

10.1116/1.587606

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Morphology and accommodation of thin-plate martensites in an Fe-Ni-C alloy have been investigated with atomic force microscopy (AFM). The quantitative observation of surface relieves made it possible to determine the kinds of thin-plate martensite variants by combining with single-face trace analysis. The martensites keep complementary configuration of variants in order to make the overall strain minimize. Strain distribution induced by the martensite formation in the parent phase was calculated using the height of the surface relief obtained by AFM observation and it was found that a highly strained region exists near the front of the martensite.

引用

页码：1813 / 1816

页数：4

共 10 条

[1] ATOMIC FORCE MICROSCOPE [J].