X-RAY SPECTRAL MEASUREMENT SYSTEM FOR NANOSECOND PLASMAS

被引:35
作者
JOHNSON, DJ [1 ]
机构
[1] USAF,WEAP LAB,KIRTLAND AFB,NM 87117
关键词
D O I
10.1063/1.1686585
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:191 / 194
页数:4
相关论文
共 18 条
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